Particle-induced X-ray emission
NON-DESTRUCTIVE ELEMENTAL ANALYSIS TECHNIQUE
Proton-induced x-ray emission; Particle induced X-ray emission; MicroPIXE; PIXE; Proton Induced X-ray Emission; Particle-induced X-ray Emission; Particle-Induced X-ray Emission
Particle-induced X-ray emission or proton-induced X-ray emission (PIXE) is a technique used for determining the elemental composition of a material or a sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the x-ray part of the electromagnetic spectrum specific to an element.